Jump-diffusion based-simulated expected shortfall (SES) method of correcting value-at-risk (VaR) under-prediction tendencies in stressed economic climate

Abstract

Value-at-Risk (VaR) model fails to predict financial risk accurately especially during financial crises. This is mainly due to the model’s inability to calibrate new market information and the fact that the risk measure is characterised by poor tail risk quantification. An alternative approach which comprises of the Expected Shortfall measure and the Lognormal Jump-Diffusion (LJD) model has been developed to address the aforementioned shortcomings of VaR. This model is called the Simulated-Expected-Shortfall (SES) model. The Maximum Likelihood Estimation (MLE) approach is used in determining the parameters of the LJD model since it’s more reliable and authenticable when compared to other nonconventional parameters estimation approaches mentioned in other literature studies. These parameters are then plugged into the LJD model, which is simulated multiple times in generating the new loss dataset used in the developed model. This SES model is statistically conservative when compared to peers which means it’s more reliable in predicting financial risk especially during a financial crisis.