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An Image Catalogue of Micron- and Sb-micron-Sized Constrictions Fabricated with the Femtosecond Laser and Created with the AFM

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dc.contributor.author Umenne, Patrice
dc.date.accessioned 2024-05-10T13:25:03Z
dc.date.available 2024-05-10T13:25:03Z
dc.date.issued 2023-06-12
dc.identifier.citation https://doi.org/10.1007/s11837-023-05917-0 en
dc.identifier.issn 1047-4838
dc.identifier.uri https://hdl.handle.net/10500/31193
dc.description.abstract In this article a series of constrictions in the micron and sub-micron range fabricated with the femtosecond laser on superconducting YBa2Cu3O7 thin films is scanned with an atomic force microscope (AFM). The AFM images of the resulting constrictions are depicted. The width of the constrictions fabricated range from 1.24 um micron dimension to 812 nm in the sub-micron range. The laser ablation spot size or diameter is set at 15.8 lm for the femtosecond laser and the separation distance between the centers of the laser ablation spots is varied between (16–17) lm as a result generating the variable constriction widths for the different superconductive bridges. The images of the fabricated micron and sub-micron constrictions are shown as a catalogue in the article. The AFM images give the surface morphology, dimensions, and physical continuity of the fabricated constriction qubits. The I–V characteristics of the constrictions are measured and validate the electrical continuity and superconductivity of the fabricated constrictions. en
dc.description.sponsorship University of South Africa en
dc.language.iso en en
dc.publisher Springer en
dc.subject Atomic Force Microscope (AFM) images en
dc.subject Constrictions en
dc.subject Femtosecond Laser en
dc.subject Laser ablation spot size en
dc.subject Separation Distance between the centers of the laser ablation spots en
dc.title An Image Catalogue of Micron- and Sb-micron-Sized Constrictions Fabricated with the Femtosecond Laser and Created with the AFM en
dc.type Article en
dc.description.department Electrical and Mining Engineering en


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