Microwave Power dependence of the I-V Characteristics of Submicron and Micron YBCO Constrictions.

dc.contributor.author	Patrice Umenne.
dc.contributor.author	V.V Srinivasu.
dc.date.accessioned	2019-09-19T12:16:38Z
dc.date.available	2019-09-19T12:16:38Z
dc.date.issued	2018-05-08
dc.identifier.isbn	978-0-7354-1648-2
dc.identifier.uri	http://hdl.handle.net/10500/25781
dc.description	Conference paper published by Patrice Umenne Electrical Engineering Department	en
dc.description.abstract	In this paper, the femtosecond laser technique was used to fabricate micron and submicron sized Josephson Junctions. The influence of an RF signal of frequency 19.5 GHz on the critical current of the micron sized Josephson junction of width 2.1 μm and the sub-micron sized Josephson junction of width 816 nm was analyzed. Both junctions showed the presence of Shapiro-like steps and critical current suppression due an increase in the RF Power. Critical current suppression occurs due to the varying magnetic field produced by the RF signal power.	en
dc.description.sponsorship	The University of South Africa	en
dc.language.iso	en	en
dc.publisher	American Institute of Physics (AIP) Conference Proceedings	en
dc.subject	Femtosecond laser	en
dc.subject	RF Power	en
dc.subject	Josephson Junctions.	en
dc.title	Microwave Power dependence of the I-V Characteristics of Submicron and Micron YBCO Constrictions.	en
dc.type	Article	en
dc.description.department	College of Engineering, Science and Technology	en